Please use this identifier to cite or link to this item: https://ruomoplus.lib.uom.gr/handle/8000/1765
Title: Exploring the relationship between quality management and risks in closed-loop supply chains
Authors: Madas, Michael 
Nikolaidis, Yiannis 
Author Department Affiliations: Department of Applied Informatics 
Department of Applied Informatics 
Author School Affiliations: School of Information Sciences 
School of Information Sciences 
Subjects: FRASCATI__Social sciences__Economics and Business__Business and Management
Keywords: closed-loop supply chain
CLSC
quality management
reverse logistics
risk
Issue Date: 2023
Publisher: Inderscience
Journal: International Journal of Logistics Systems and Management 
ISSN: 1742-7967
Volume: 44
Issue: 4
Start page: 431
End page: 457
Abstract: 
Supply chain risks are highly unpredictable and may affect the entire spectrum of supply chain actors, with direct implications on cost, product/process quality, lead time, company’s image and profitability. Existing literature in supply chain risk management (SCRM) has not sufficiently addressed risk management in the context of closed-loop supply chains (CLSC) and has not thoroughly investigated potential linkages between risks and quality management (QM). In our paper, we develop a typology of CLSC risks and explore the potential contribution of QM systems, principles and practices in dealing with CLSC risks. Various QM tools can be employed to reduce the occurrence or impact of risks associated with reconditioned or returned products. Unfortunately, certain important risk categories are difficult to mitigate by means of QM. Indicative examples are the consolidation of return flows to remanufacturers, inefficient marketing techniques for recovered products, as well as uncertainties related to quantity and timing of returns.
URI: https://ruomoplus.lib.uom.gr/handle/8000/1765
DOI: 10.1504/IJLSM.2023.130781
Rights: Attribution-NonCommercial-NoDerivatives 4.0 Διεθνές
Corresponding Item Departments: Department of Applied Informatics
Department of Applied Informatics
Appears in Collections:Articles

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